Chip Design Contest(CDC)

A Highly Reliable Embedded STT-MRAM Physical Unclonable Function with Two-Step Post-Processing

• 논문번호 : 202603078
• 주저자 : Donghan Ko
• 소속 : Yonsei University
• 지도교수 : 정성욱
• 전시담당자 : Wangyu Lee(wk4906@yonsei.ac.kr)